Wednesday July 18, 2007

During the morning, we had more practice making films and wrinkling. We made two films each, then floated and wrinkled them, taking pictures to use for data analysis later. After lunch, Dave made a film and we placed it in the reflectometer to determine its thickness. While it was processing (90 minutes) we made some films on silicon wafers instead of glass slides.



We lowered the spin speed to thicken the polystyrene coat. We then met Ling who showed us a new instrument for measuring thickness, the interferometer. The interferometer is made by Filmetrics and uses optics to measure thicknesses between 30 nm and 1 micron. It is not as accurate as the X-Ray reflectometer. More information about the interferometer can be found here.